UART realization with BIST architecture using VHDL

The increasing growth of sub-micron technology has resulted in the difficulty of testing. Design and test engineers have left no choice but to accept new responsibilities that had been performed by group of technicians in the previous years. Design engineers who do not design systems with full testability had increased the possibility of product failures and missed market opportunities. BIST is a design technique that allows a circuit to test itself. In this approach the test performance achieved with the implementation of BIST is proven to be adequate to offset the disincentive of the hardware overhead produced by the additional BIST circuit. The technique can provide shorter test time compared to an externally applied test and allows the use of low-cost test equipment during all stages of production.